AFM calibration

Company NT-MDT Spectrum Instruments supply with the full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

	TGQ1 Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.
	TGT1 Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.
	TGZ1 Calibration grating TGZ1 for SPM Z-axis calibration (step height 20,0±1.5nm).
	TGZ2 Calibration grating TGZ2 for SPM Z-axis calibration (step height 110±2 nm).
	TGZ3 Calibration grating TGZ3 for SPM Z-axis calibration (step height 520±3 nm).
	TGG1 Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.
	TGX1 Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.

AFM submicron calibration (278nm)

Company NT-MDT Spectrum Instruments supply with the grating for SPM and STM submicron calibration in X or Y direction.

	TDG01 Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.

Grating sets Company NT-MDT Spectrum Instruments offer three different grating sets.   TGS1 Grating set for Z-axis SPM calibration with three different height range - 20nm, 110nm, 520nm.   TGS2 Grating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.   TGS1_PTB Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate.   TGSFull Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.   TGS_Cert Set of calibration standards for SPM with International Calibration Cetficates. Intended for lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.   TGS1F Grating set for Z-axis SPM calibration with four different height range - 20nm, 110nm, 520nm, 1400nm.