產品介紹

Single Crystal Diamond Tip

SCD probes are single crystal diamond tips specially grown in CVD process and glued to silicon cantilevers for use in AFM. The growth technology provides durable probes with high aspect ratio and small tip radius by affordable price comparable to that of traditional silicon probes. After gluing, each tip passes quality control on SEM before packaging. Beacuse of the high hardness of diamond, the tip can be used for surface modifications and measuring properties of hard materials like silicon, glass, metals, etc. The probe is highly resistant to wear, which is especially useful when fast scanning speed is needed, or when or when there are sharp and rigid edges on surface.

產品說明

Single
Crystal
Diamond Tip

Beacuse of the high hardness of diamond, the tip can be used for surface modifications and measuring properties of hard materials like silicon, glass, metals, etc. The probe is highly resistant to wear, which is especially useful when fast scanning speed is needed, or when or when there are sharp and rigid edges on surface.

SEM image of single crystal diamond (SCD) tip for SPM.

SEM image of the tip aspect ratio over 2 microns from the end. Full cone angle from 5° to 10°.

SEM image of the SCD tip end. Tip radius less than 10 nm.

Raman spectra of SCD tips. Thin diamond line at 1332 cm^-1.

Tip material	Single Crystal Diamond (SCD)
Tip radius	5-10 nm
Tip aspect ratio*	more than 5:1
Tip full cone angle*	less than 10°
SCD orientation	<100> along the tip axis

*When measured at least on the last 1 µm of the tip end.

Glue type**	Non-conducting
Glue temperature stability	70°C (160°F)

**The glue is chemically stable in water, ethanol, in presence of chloride ions, biological buffers (PBS, Hanks solution, etc); not stable in ketones, DMSO.

Download a brief catalog of diamond SCD probes for AFM:

產品應用

Applications

SCD diamond tip is:
> Long life and forgiving AFM operation mistakes, advantageous when tip replacement is hard or time-taking
> Used for nanoindentation, mapping properties of hard materials and material contrast
> Used for scratching and pulse force lithography on hard materials¹
> Used for imaging high aspect ratio features on surface
> Applicable to measuring magnetic fields with high sensitivity via photo luminescence detection²

It was also reported that SCD probes can be used for long-time scanning of sticky biological samples without
contamination, which can be related to the low surface energy of diamond >>>.

1. A. Temiryazev. Pulse force nanolithography on hard surfaces using atomic force microscopy with a sharp single-crystal diamond tip. Diamond & Related Materials 48 (2014) 60–64. arXiv:1312.0796
2. R. Nelz et al, Color center fluorescence and spin manipulation in single crystal, pyramidal diamond tips. arXiv:1608.08369

產品規格

Cantilevers

SCD diamond probes are glued onto rectangular (diving-board) silicon etched cantilevers. The range of spring
constants and resonant frequencies of cantilevers available covers the Contact mode, Force Modulation,
Non-Contact and Tapping mode. Cantilever backside is coated by Aluminium.

The chip holder size is 1.6 mm x 3.4 mm x 0.4 mm.

Part Number	Resonant Frequency, kHz	Spring Constant, N/m	AFM mode
ART D10	10	0.15	Contact mode
ART D80	80	3.5	Tapping mode. Force modulation. Contact mode. Imaging in a liquid cell.
ART D160	160	5	Tapping mode. Contact mode on hard surfaces.
ART D300	300	40	Tapping mode. Non-contact mode. Contact mode on hard surfaces. Nanoindentation. Force nanolithography.

Note: The glue used to attach the tip to the cantilever is not conducting, so the probe is not applicable for conductive AFM measurements. Values for resonant frequencies and spring
constants are typical.

Packaging

Probes are packaged by 5 or 10 per container.