產品介紹

LEA-S500® LIBS Elemental Analyzer

LEA-S500 – is a modern powerful atomic - emission spectral instrument with multichannel spectrum registration, combining in itself innovation technologies in the area of laser, spectral, measuring, digital equipment and software and permitting elemental (chemical) analysis of a sample in minutes. The detectable elements are from H to U, measuring range is to 100%. Necessary weight of the analyzed material is from 50 nanograms. The time period of multi-element analysis including sample preparation is 1 – 15 minutes. 400 analyses on determination of material homogeneity take about 7 minutes.

產品說明

LEA-S500 – is a modern powerful atomic - emission spectral instrument with multichannel spectrum registration, combining in itself innovation technologies in the area of laser, spectral, measuring, digital equipment and software and permitting elemental (chemical) analysis of a sample in minutes. The detectable elements are from H to U, measuring range is to 100%. Necessary weight of the analyzed material is from 50 nanograms. The time period of multi-element analysis including sample preparation is 1 – 15 minutes. 400 analyses on determination of material homogeneity take about 7 minutes.  LIBS LIBS LIBS LIBS 雷射誘導擊穿光譜

Intuitive software of LEA-S500 guarantees operation of the instrument from the first opeartion. Only several hours and minimum special knowledge is needed to learn basic functions of the device.

Two-pulse nanosecond laser source of spectra excitation, due to high energy, power and temporal stability, provides a maximal reproducibility of the analysis results and low detection limits of chemical elements and compounds. Simultaneously it provides arc and spark modes of spectra excitation. 雷射誘導擊穿光譜

High-quality light throughput aberration-free high-resolution spectrograph provides accurate and reliable measurements.

Unique detection system of short pulsed light signals provides extremely low limits of elements detection and a linearity of concentration dependences in a wide range.雷射誘導擊穿光譜

 

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. fig1 LEA-S500 315x435

 

Detection limits

Advantages

Software

 

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. Laser S-pulse-mode eng orange

one-pulse spectra excitation mode

  Two-pulse nanosecond laser
In the elemental analyzer LEA – S500 plasma of a sample material, arising due to the treatment of material with powerful light pulses, is used as a light source to obtain an atomic - emission spectrum.
It has been experimentally revealed, that when a sample is treated with two successive laser pulses (with time delay not exceeding the plasma lifetime) an essential growth of intensity and spectral lines stability in comparison with one-pulse excitation mode is provided. The given effect reduces substantially the lower limit of elements detection, increases measurements accuracy, extends analytical potential owing to excitation of lines with high ionization energy.

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. Laser D-pulse -mode eng jrange

two-pulse spectra excitation mode

 

Our innovative solutions guarantee:

>  High accuracy and precision determination of elements and their compounds (oxides) in the samples
>  Low detection limit of elements (from 0.01 ppm to 1ppb)
>  Analysis of various elements in any conductive, nonconductive solid (monolithic and powder) samples
>  Use of analytic lines at the optimal concentration sensitivity, free from spectral overlaps
>  Maximal efficiency of analytical light signal
>  Ease at operation and service
>  Safe operation and protection of personnel from harmful factors
  Detection system
Use of digital cameras with multi-element spectrum detection systems in spectral instruments is conditioned by a number of advantages before the traditional detection systems 
(photo-electronic multipliers, photo-plates and etc.). The main of them are: the opportunity of simultaneous detection of a wide spectrum range; high-speed performance, providing detection of spectra excited with frequency pulsed sources, what allows one to make a large number of measurements per a time unit (in our case it is 20 times per second); wide range of spectral sensitivity; low dark signals (noise); wide dynamic range. As a radiation receiver in digital cameras matrix charge-coupled devices (CCD) are used, which are referred to the type of photosensitive (photoelectric) 
charge-transfer devices (CTD). Quantum efficiency of modern semiconductor radiation receivers is 90% and higher.
Spectrograph
Spectrograph performs radiation spectral analysis. 
This analysis is realized in optics by means of an element deviating the beams with various wavelengths to different angles.

產品應用

 

>  Glass industry
>  Cement industry
>  Manufacturing of ceramics
>  Geological industry
>  Semiconductor industry
>  Ferrous and non-ferrous metallurgy
>  Construction materials
>  Forensic science
>  Scientific research in the institutes and laboratories
>  Material science
>  Engineering industry
>  Mining and processing of raw materials
>  Environment protection
>  Archaeology
>  Agriculture (feed, tea production)
>  Medicine
>  Pharmacology
>  Certification


Laser elemental analyzer LEA-S500 is applied for qualitative, semi-quantitative and quantitative elemental (chemical) analysis of raw material, components, additives, admixtures, inclusions at all stages of manufacturing process; for control of finished products at factories; for scientific investigations.


The instrument allows to perform both general averaged multi-element analysis of a sample and local analysis of small
volume and mass.


The instrument is of great importance for the organizations where much care is taken about their personnel health.


LEA-S500 provides safe chemical analysis of the materials and components. An operator is completely protected from
harmful factors connected with the analysis.


Only several hours are needed for the instrument operation training.

產品規格

Detection limits

 

Detection limit means a minimal content of the element in a sample, detected with the instrument.


Usually a concentration, at which the analytical signal detected with the instrument equals to a triple value of a standard deviation of noise signal, is taken for a detection limit. Obtaining of such signal is a sufficient reason for making a decision on presence of the searched component.


Detection limit is a parameter sensitive to measurement conditions and a sample characteristic.

 

H
100
  Detectable Elements
with selected detection limits, ppm
1 ppm = 0.0001%
  He
100
Li
0.01
Be
0.07
B
2
C
1
N
< 100
O
< 100
F
20
Ne
< 100
Na
0.05
Mg
0.1
Al
1
Si
3
P
20
S
10
Cl
100
Ar
< 100
K
0.06
Ca
0.1
Sc
10
Ti
0.3
V
1
Cr
1
Mn
0.2
Fe
0.5
Co
0.2
Ni
0.8
Cu
0.1
Zn
0.5
Ga
< 100
Ge
2
As
40
Se
< 100
Br
200
Kr
< 100
Rb
1
Sr
0.2
Y
10
Zr
1
Nb
5
Mo
1
Tc
< 100
Ru
< 100
Rh
< 100
Pd
< 100
Ag
0.1
Cd
0.2
In
5
Sn
10
Sb
10
Te
< 100
I
< 100
Xe
< 100
Cs
< 100
Ba
0.2
Lu
< 100
Hf
5
Ta
< 100
W
5
Re
< 100
Os
< 100
Ir
< 100
Pt
< 100
Au
1
Hg
< 100
Tl
1
Pb
0.3
Bi
5
Po
< 100
At
< 100
Rn
< 100
Fr
< 100
Ra
< 100
 
  La
40
Ce
4
Pr
< 100
Nd
< 100
Pm
< 100
Sm
< 100
Eu
< 100
Gd
< 100
Tb
1
Dy
< 100
Ho
< 100
Er
10
Tm
< 100
Yb
1
  Ac
< 100
Th
< 100
Pa
2
U
30