SSS-NCH  
[f_o: 320 kHz , C: 42 N/m ] 
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology


SSS-NCL  
[f_o: 190 kHz , C: 48 N/m ] 
(long cantilever 225 µm)
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology


SSS-SEIH  
[f_o: 130 kHz , C: 15 N/m ] 
(for SEIKO AFMs)
SuperSharpSilicon™ AFM Probe silicon cantilever for Non-Contact / TappingMode with SuperSharpSilicon™ Tip based on Pointprobe® technology