Contact-G

Contact Mode AFM Probe
Coating: none 
Tip Shape: Rotated 

Cantilever:
F 13 kHz   C  0.2 N/m   L  450 µm

ContAl-G

Contact Mode AFM Probe with Aluminum Reflective Coating
Coating: Reflex Aluminum 
Tip Shape: Rotated 

Cantilever:
F 13 kHz   C  0.2 N/m   L  450 µm

SiNi

Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip
Coating: Reflex Gold 
Tip Shape: Pyramid 

Cantilevers: 2
F 30 kHz   C  0.27 N/m   L  100 µm
F 10 kHz   C  0.06 N/m   L  200 µm