產品介紹

Conductive AFM Probes

產品說明


Multipurpose AFM Probe with 4 Different Cantilevers and Conductive Diamond Tip Coating
Coating: Conductive Diamond  
Tip Shape: Rotated  

Cantilever:
F  19 kHz    C  0.5 N/m   L  500 µm
F  110 kHz   C  6.5 N/m   L  210 µm
F  200 kHz  C   18 N/m   L  150 µm
F  450 kHz  C  100 N/m  L  100 µm


Tapping Mode AFM Probe with Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilever:
F  300 kHz    C  40 N/m   L  125 µm



Tapping Mode AFM Probe with Long Cantilever and Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilever:
F  190 kHz    C  48 N/m   L  225 µm


Soft Tapping Mode AFM Probe with Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilever:
F  150 kHz    C  5 N/m   L  125 µm


Force Modulation AFM Probe with Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilever:
F  75 kHz    C  3 N/m   L  225 µm


Contact Mode AFM Probe with Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilever:
F  13 kHz    C  0.2 N/m   L  450 µm


Multipurpose AFM Probe with 4 Different Cantilevers and Platinum Overall Coating
Coating: Electrically Conductive  
Tip Shape: Rotated  

Cantilevers:
F  15 kHz    C  0.2 N/m   L  500 µm
F  80 kHz    C  2.7 N/m   L  210 µm
F  150 kHz   C  7.45 N/m  L  150 µm
F  350 kHz  C  40 N/m    L  100 µm

產品應用