產品介紹
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Force Modulation Probes
Our standard silicon, Force Modulation probes are available with Au reflective coating. Al reflective coating is available upon special request. Extremely sharp tips allow the user to obtain high-quality images of samples. Standard chip sizes make our probes compatible with most AFM manufacturers.
產品說明
Specifications
| Cantilever | Length | Width | Thickness | Resonant Frequency kHz | Force Constant Nm | ||||
|---|---|---|---|---|---|---|---|---|---|
| ± 10μm | ± 5μm | ± 0.5μm | min | typical | max | min | typical | max | |
| FMG01 | 225 | 32 | 2.5 | 40 | 60 | 96 | 1 | 3 | 5 |
Cantilever Specifications
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ω-cm, Antimony doped |
| Cantilever Geometry | Rectangular (cross-section is trapezium) |
| Back Side Coating | Au reflective coating (reflectivity is 3x better in comparison with uncoated probes); conductive coatings also available |
Tip Specifications
| Tip Geometry | Tetrahedral, the last 500 nm from tip apex is cylindrical |
| Tip Height | 14 – 16 μm |
| Tip Aspect Ratio | 3:1 – 7:1 |
| Tip Offset (Setback) | 5 – 20 μm |
| Tip Front Angle | 10 ± 2° |
| Tip Back Angle | 30 ± 2° |
| Tip Side Angle (half) | 18 ± 2° |
| Tip Cone Angle | 7 – 10° |
| Tip Curvature Radius (Nom) | 6 nm (uncoated) |
| Tip Curvature Radius (Max) | 10 nm (guaranteed) |
General Information
> Standard chip size: 1.6×3.4×0.3 mm> The base silicon is highly doped to avoid electrostatic charges.