產品介紹
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Magnetic Probes
NT-MDT offers a new development – high resolution long lifetime magnetic probes. The proper probe is very important during magnetic measurements. Magnetic probes should provide high resolution images and “survive” under high-humidity conditions. Our magnetic probes have special protective layers to help avoid oxidation and increase cantilever lifetime. Sharp silicon tips with coatings less than 40 nm allow you to obtain 20-30 nm magnetic resolution. Low Moment high resolution magnetic probes probes have 15nm CoCr coating, which is two times thinner compared to standard MFM tips. Decreasing the magnetic moment of MFM tip is important in imaging low coercitive magnetic samples, such as iron garnet films with coercitivity of approximately 20 Oe.
產品說明
Specifications
| Cantilever | Length | Width | Thickness | Resonant Frequency kHz | Force Constant Nm | |||||
|---|---|---|---|---|---|---|---|---|---|---|
| ± 10μm | ± 5μm | ± 0.5μm | min | typical | max | min | typical | max | ||
| MFM01 | 225 | 32 | 2.5 | 47 | 70 | 90 | 1 | 3 | 5 | |
| MFM10 | 125 | 40 | 2 | 87 | 150 | 230 | 1.45 | 5.1 | 15.1 | |
| MFM_LM (Low Moment) | 225 | 32 | 2.5 | 47 | 70 | 90 | 1 | 3 | 5 | |
| MFM_HC (High Coercivity) | 225 | 32 | 2.5 | 47 | 70 | 90 | 1 | 3 | 5 | |
Cantilever Specifications
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ω-cm, Antimony doped |
| Cantilever Geometry | Rectangular |
| Back Side Coating | High reflective Al backside coating |
Tip Specifications
| Tip Geometry | Tetrahedral, the last 500 nm from tip apex is cylindrical |
| Tip Coating | MFM01, MFM10, MFM_LM: CoCr magnetic tip side coating with additional layers protecting from oxidation MFM_HC: Co-based high coercivity alloy with additional layers protecting from oxidation |
| Tip Coating Thickness | MFM01, MFM10: 30-40 nm* MFM_LM: 15-20 nm* MFM_HC: 50 nm* |
| Tip Height | 14 – 16 μm |
| Tip Aspect Ratio | 3:1 – 7:1 |
| Tip Offset (Setback) | 5 – 20 μm |
| Tip Front Angle | 10 ± 2° |
| Tip Back Angle | 30 ± 2° |
| Tip Side Angle (half) | 18 ± 2° |
| Tip Cone Angle | 7 – 10° |
| Tip Curvature Radius (Nom) | MFM01, MFM10, MFM_HC: 40 nm MFM_LM: 25-30 nm |
*At customer request we can make probes with different coating thickness to achieve different magnetic moments which will be the best for measuring of your samples.
General Information
> Standard chip size: 1.6×3.4×0.3 mm> The base silicon is highly doped to avoid electrostatic charges.