產品介紹

Contact Mode AFM Probes

Long Cantilever (450µm) silicon contact mode probes	Reflex coating: Aluminum coating for higher laser reflectance
CONT [f_o: 13 kHz , C: 0.2 N/m ] Pointprobe® Silicon AFM Probe	CONTR [f_o: 13 kHz , C: 0.2 N/m ] Pointprobe® Silicon AFM Probe backside: reflex coating
Arrow™ CONT [f_o: 14 kHz , C: 0.2 N/m ] Arrow™ Silicon AFM Probe	Arrow™ CONTR [f_o: 14 kHz , C: 0.2 N/m ] Arrow™ Silicon AFM Probe backside: reflex coating
	ZEILR [f_o: 27 kHz , C: 1.6 N/m ] (for Zeiss Veritekt AFMs) Pointprobe® Silicon AFM Probe backside: reflex coating

Short Cantilever (225µm) silicon contact mode probes	Reflex coating: Aluminum coating for higher laser reflectance
CONTSC [f_o: 25 kHz , C: 0.2 N/m ] Pointprobe® Silicon AFM Probe	CONTSCR [f_o: 25 kHz , C: 0.2 N/m ] Pointprobe® Silicon AFM Probe backside: reflex coating

Silicon Nitride (SiN) contact mode probes	Reflex coating: Aluminum coating for higher laser reflectance
PNP-DB [f_o: 17 kHz , C: 0.06 N/m ] [f_o: 67 kHz , C: 0.48 N/m ] Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short rectangular cantilevers	PNP-TR [f_o: 17 kHz , C: 0.08 N/m ] [f_o: 67 kHz , C: 0.32 N/m ] Pyrex-Nitride AFM Probe for various imaging applications in contact or dynamic mode measurement and biological samples, two long and two short triangular cantilevers.