產品介紹

Electrical AFM Probes (EFM, SCM, Tuna, SSRM)

Platinum Irindium5 (Ptlr5) coated probes
EFM [f_o: 75 kHz , C: 2.8 N/m ] Conductive Pointprobe® Silicon AFM Probe for Electrostatic Force Microscopy back and tip side: platinum iridium5 (PtIr5) coatingbe	NCHPt [f_o: 320 kHz , C: 42 N/m ] Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode back and tip side: platinum iridium5 (PtIr5) coating
Arrow™ EFM [f_o: 75 kHz , C: 2.8 N/m ] Conductive Arrow™ Silicon AFM Probe silicon cantilever for Electrostatic Force Microscopy back and tip side: platinum iridium5 (PtIr5) coating	Arrow™ NCPt [f_o: 285 kHz , C: 42 N/m ] Conductive Arrow™ Silicon AFM Probe silicon cantilever for Non-Contact / TappingMode back and tip side: platinum iridium5 (PtIr5) coating
Arrow™ CONTPt [f_o: 14 kHz , C: 0.2 N/m ] Conductive Arrow™ Silicon AFM Probe silicon cantilever for Contact Mode back and tip side: platinum iridium5 (PtIr5) coating	CONTPt [f_o: 13 kHz , C: 0.2 N/m ] Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Contact Mode back and tip side: platinum iridium5 (PtIr5) coating
NCLPt [f_o: 190 kHz , C: 48 N/m ] (long cantilever 225 µm) Conductive Pointprobe® Silicon AFM Probe, silicon cantilever for Non-Contact / TappingMode back and tip side:

Conductive Diamond coated probes	Reflex coating: Aluminum coating for higher laser reflectance
CDT-NCHR [f_o: 400 kHz , C: 80 N/m ] Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode tip side: conductive diamond coating backside: reflex coating	CDT-NCLR [f_o: 210 kHz , C: 72 N/m ] (long cantilever 225 µm) Conductive Diamond Coated Tip, silicon cantilever for Non-Contact / TappingMode tip side: conductive diamond coating backside: reflex coating
CDT-FMR [f_o: 105 kHz , C: 6.2 N/m ] Conductive Diamond Coated Tip, silicon cantilever for Force Modulation Mode tip side: conductive diamond coating backside: reflex coating