Tipless cantilevers for various custom applications such as attaching spheres. Three tipless cantilevers per chip Tipless |
Probes with special coatings for conductive AFM modes. 40 nm radius tip DPE (low-noise) 20 nm radius tip DPER (high-resolution) 30 nm radius tip Pt coated 35 nm radius tip Cr-Au coated |
Probes with magnetic coating for MFM. 60 nm radius magnetic tip Co-Cr coated |
Probes with silicon nitride cantilevers and tips. 10-30 nm radius pyramidal tip XNC12 |