客戶服務
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檢測分析服務
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Applications Notes 應用文件
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Webinars 線上學習
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FAQ 常見問題
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- 1.During semicontact measurements jumps in topography appear during the scan process, that correspond to the measured height changes abruptly by about 2 nm and the change of phase is very high too. Do you have any recommendation how to avoid this problem?
- 2.How can I change a refresh period of an internal oscilloscope?